Design Of Finite State Machine Memory Built-In Self Test

Siti Aishah, Mat Junos@Yunus (2006) Design Of Finite State Machine Memory Built-In Self Test. Project Report. UTeM, Melaka, Malaysia. (Submitted)

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Abstract

This project is designing a Design for Test (Dff) technique to test embedded memory called Finite State Machine (FSM) Memory Built-In Self Test (MBIST). The design is written using Very High Speed Integrated Circuit Hardware Design Language, (VHDL) based on the FSM architecture. The architecture will be modelled using Register Transfer Level (RTL) abstraction. A simulation on two testing algorithms is implemented on this architecture. Evaluation on area and testing time of these algorithms are carried out. The area is referring to number of logic gates used to build the circuit. While, the testing time is the completion time for testing the embedded Memory. Lastly, a comparison to Microcode Memory Built- In Self Test (MBIST) architecture evaluation is performed.

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