Implementation of memory BIST controller in FPGA using the improved March AZ1 as the test algorithm

Clement, Ooi Jun Jie (2025) Implementation of memory BIST controller in FPGA using the improved March AZ1 as the test algorithm. Project Report. Universiti Teknikal Malaysia Melaka, Melaka, Malaysia. (Submitted)

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Abstract

This project aims to develop and implement a Memory Built-In Self-Test (MBIST) controller in an FPGA device using the Improved March AZ1 algorithm. MBIST is essential for testing memory components within a System-on-Chip (SoC) to ensure they are free of faults. The numbers of test operations increases and results in a higher complexity to detect more faults in the test and will increases the cost and hardware area overhead. The March AZ algorithm was selected for its efficiency in detecting various memory fault models. To overcome more faults in the test, the numbers of test operations increases and results in a higher complexity. The project is proposed to improve the March AZ algorithm’s fault coverage as the March AZ1 algorithm while maintaining its complexity is equal to the complexity of 13N. The March AZ1 algorithm is improved by rearranging the test sequences of the March AZ algorithm. Extensive testing on fault-free and fault-injected memory models will be demonstrate the controller's effectiveness in detecting a wide range of memory faults, validating its reliability. The project is successfully implement an effective MBIST solution in FPGA, providing a valuable tool for ensuring memory reliability in SoCs. Future work could be focus on further optimizing the MBIST controller and adapting the algorithm for different memory technologies.

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