The application of TRIZ reduce speed loss in semiconductor manufacturing industry

Lim, Suzanne Shien Thung (2016) The application of TRIZ reduce speed loss in semiconductor manufacturing industry. Project Report. Universiti Teknikal Malaysia Melaka, Melaka, Malaysia. (Submitted)

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Abstract

Semiconductor manufacturing industry concentrates to enhance the productivity by improving the equipment effectiveness under the highly competitive environment. This study was conducted in a semiconductor manufacturing company which located at Melaka. This study focused on the electrical testing machine which is the bottleneck machine in TSLP production line. Currently, the electrical testing machine is facing low overall equipment effectiveness (OEE) and low machine performance which are caused by speed loss problem. The purpose of this study is to increase the OEE and machine performance by identifying the causes of speed loss for electrical testing machine; to analyze the data for feasible solution by using TRIZ methodology and to propose solutions to reduce speed loss for electrical testing machine. The real time data for 10 electrical testing machines were collected from the Cerberus System Database. There were total 9 potential causes of speed loss that were identified using Ishikawa Diagram and Pareto Chart. Only three significant causes were focused to reduced speed loss which are retest, lot setting problem and parameter changes. To illustrate the application of TRIZ, the Contradiction Matrix and few Inventive Principles were applied in generating the solution ideas. Four solutions were proposed to reduce speed loss but only one of the solutions was implemented in the case company which is the pogo pin cleaning action. The speed loss had decreased by 2% based on one week pilot run in one of the electrical testing machine. The increase of OEE in 0.08% for 10 machines can brings approximately RM400,000 of yearly profit.

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