Characterization Of Silicon On Insulator (SOI) Mosfet Using TCAD Tools

Muhammad Nazirul Ifwat, Abd Aziz (2014) Characterization Of Silicon On Insulator (SOI) Mosfet Using TCAD Tools. Project Report. UTeM, Melaka, Malaysia. (Submitted)

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Abstract

Thisproject present the result of process and device semulation using silvaco TCAD tools to develop Silicon on insulator (SOl) MOSFET. The aim for this project is to analyze the electrical characteristic of SOl MOSFET and the effect of Buried oxide layer (BOX) with the variation of thickness. The result obtained show that as the electrical characteristic of SOl MOSFET greatly increase with the presence of BOX layer. This SOl MOSFET has higher Drive current (ION), lower Leakage current and lower Subthreshold Swing (Ss).With this increasing perfomance, the switching speed for this MOSET device increase and it has lower power consumption as the ratio of IoN/IorF is larger. For information, the larger the ratio, the lower the power consumption.This project also analyze the effect of oxide layer thickness toward the electrical characteristic and the result shown that the thickness of oxide layer increase will decrease the perfomance of device. The best thickness is 1 OOnrn thickness layer but if its to thick then the Finfet technology need to be used as prevention because when the thickness become too smal it will also decrease the perfomance.Finfet refer as one of the types of multigate transistor. The term FinFET is to describe a nonplanar, double-gate transistor built on an SOl substrate.

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