Combine Infrared Lock-In Thermography And Curve Tracer Into An Integrated System

Phung, Lee Mun (2013) Combine Infrared Lock-In Thermography And Curve Tracer Into An Integrated System. Project Report. UTeM, Melaka, Malaysia. (Submitted)

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Abstract

Both machines curve tracer and Infrared Lock-in Thermography (IR-LIT) are for troubleshooting failure semiconductor devices. IR-LIT is basically based on the application of a periodic input energy wave, which provides infrared and heat to the surface of the object being examined. By this, IR-LIT localize and detects failure parts in a discrete semiconductor device. A curve tracer is a piece of electronic test equipment used to analyse the characteristics of semiconductor devices such as reverse leakage current and reverse breakdown voltage. Based on an oscilloscope, the device contains current and voltage sources that can be used to stimulate the device under test(DUT). It works by applying a swept voltage to the terminals of the DUTs, and it measures too the amount of current that the device permits to flow at each voltage. The V-I (voltage versus current) graph or curve is displayed on an oscilloscope screen. However, failure devices can only be examined separately using both machines for troubleshooting. The purpose of this project is to build a hardware comprising of resistors, capacitors and MOSFET to combine the usage of both machines together, in order to get the waveform from the curve tracer and also the image from IR-LIT simultaneously.

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