Digital IC Tester Driven By PIC16F877A Implementing Exhaustive Test Method

Fahukmi Darul Adli, Mohd Noor (2006) Digital IC Tester Driven By PIC16F877A Implementing Exhaustive Test Method. Project Report. UTeM, Melaka, Malaysia. (Submitted)

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Abstract

Testing is a critical part in IC manufacturing. The purposes of IC testing are to ensure IC components and connections between them are in good condition for uses. Hence the output yield from it's as well as had estimated theoritically. This tester is uses the flexible programmable features of PIC16F877 A microcontroller for many applications. The microcontroller was using as a central processing unit for 1 keypad, 4 7-segrnents displays, and input and output IC under test via a ZIF socket. Keypad was function as a medium for entering IC series number. 7-segrnent display was function as a platform for displaying IC under test series numbers and results of tests. ZIF socket was function as a platform to place IC under test, and as a channel for input and output IC under test to be connected to microcontroller as central processing unit. The testing method used is exhaustive method. Through this method, all input combinations are considered for tests. For this project, IC might be tested have 2 inputs so that 4 input combinations been considered for each test.

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