Design Of Microcode Memory Built-In Self Test

Mohd Nor'Aswadi, Mohammad (2007) Design Of Microcode Memory Built-In Self Test. Project Report. UTeM, Melaka, Malaysia. (Submitted)

	PDF (24 Pages) Design_Of_Microcode_Memory_Builts_In_Self_Test.pdf - Submitted Version Download (3MB)
	PDF (Full Text) Design_Of_Microcode_Memory_Builts_In_Self_Test.pdf - Submitted Version Restricted to Registered users only Download (17MB)

Abstract

This project is designing a Design for Test (DfT) technique to test embedded memory called Microcode Built- ln Self Test (MBIST). The design is written using Very High Speed Integrated Circuit Hardware Design Language, (VHDL) based on the Microcode architecture. The architecture will be modelled using Register Transfer Level (RTL) abstraction. A simulation on two testing algorithms is implemented on this architecture. Evaluation on area and testing time of these algorithms are carried out. The area is referring to number of logic gates used to build the circuit. While, the testing time is the completion time for testing the embedded Memory. Besides that a comparison to Finite State Machine Memory Built- ln Self Test (FSMBIST) architecture evaluation is performed. Lastly, The advantages of Microcode Built- ln Self Test (MBIST) will be presented in another chapter below.

Actions (login required)

View Item