A triz approach to reduce cycle time in semiconductor test process

Chiong, Li Shen (2017) A triz approach to reduce cycle time in semiconductor test process. Project Report. Universiti Teknikal Malaysia Melaka, Melaka, Malaysia. (Submitted)

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Abstract

Companies are focusing on how to improve and reduce the manufacturing cycle time to increase the profit and throughput. This project was carried out in a multinational semiconductor company. The company is now experiencing with low throughput due to the long close lot cycle time in the test process. In the test process, a lot will undergo a series of operations which are vision, testing and taping operation, 100% visual testing operation and quality final clearance operation and the time taken is defined as close lot cycle time or lead time of the test process. The purpose for this project is to reduce cycle time of the operations in the test process. The objectives are to identify the type of the operations that are not meet with the planned cycle time, to investigate the problems related to the cycle time of the operations in the test process and to analyse and to propose the solutions to reduce the cycle time of the operations in the test process. TRIZ methodology was deployed in this project. First, cycle time data of the three operations was extracted from the data acquisition system and analysed with the bar chart to determine which type of the operations that are not meet with planned cycle time. Based on the data analysis, only vision, testing and taping operation are not meet with planned cycle time. Then, Cause and Effect analysis was conducted to determine its potential root causes. After that, Trimming was apply to remove all nonsignificant root causes and determine the most significant root causes. Lastly, Contradiction Matrix was used on the most critical root causes to propose solutions by implementing the 40 Inventive Principles concept. A total of 4 solutions were proposed but only 3 solutions were being implemented for pilot run on 1 machine. The result of pilot run showed that those solutions are able to reduce cycle time of the vision, testing and taping operation by 14.63% and increase the OEE of the testing machine by 14.36%. According to the cost estimation of the company, by increasing 14.36% in OEE allows the company earn around RM 1,148,800 in a year. Additionally, it help to reduce maintenance and repair cost and increase the yield of the products which allows the company to achieve high throughput.

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