Siti Hajar, Hashim (2010) Development Of Automated Test System For Electronics Measurement. Project Report. UTeM, Melaka, Malaysia. (Submitted)
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Abstract
The purpose of this project is to build the system to control the Automated ystem (ATS) by using computer data acquisition. With data acquisition re and signal converting/conditioning circuits, a computer may measure nt physical quantities. It can measure the parameters, such as current, voltage c of the electronic component It will display the result in graph and show the measurement is PASS or FAIL according to the measurement we had set. ystem is control by LabVIEW where LabVIEW is one of the most-used re for data acquisition. LabVIEW can be a software interface between ent that is build by Nl.
| Item Type: | Final Year Project (Project Report) |
|---|---|
| Uncontrolled Keywords: | Computer programming, Computer graphics |
| Subjects: | Q Science > Q Science (General) Q Science > QA Mathematics > QA76 Computer software |
| Divisions: | Library > Final Year Project > FKEKK |
| Depositing User: | Users 136 not found. |
| Date Deposited: | 16 Aug 2012 02:57 |
| Last Modified: | 28 May 2015 03:33 |
| URI: | http://digitalcollection.utem.edu.my/id/eprint/5348 |
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