Hardware development of IC tester for digital logic gates

Musa, Nur Hidayu (2021) Hardware development of IC tester for digital logic gates. Project Report. Universiti Teknikal Malaysia Melaka, Melaka, Malaysia. (Submitted)

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Abstract

Testing is a critical part in IC manufacturing. The purposes of IC testing are to ensure IC components and connections between them are in good condition for uses. The objective for this project is to achieve by develop the hardware digital IC testing hardware for IC logic gates and analyses the efficiency of the system for the selected IC. The method used in the project is by simulation and assemble the component. Hence the output generates from as well as had estimated theoretically based on the truth table. This tester is using the flexible programmable features of PIC16F887 microcontroller for many applications. The microcontroller was using as a central processing unit for 2 push button, 16x2 segments displays, and input and output IC under test via a ZIF socket. Keypad was function as a medium for entering IC series number. 16x2 segment display was function as a platform for displaying IC under test series numbers and results of tests. ZIF socket was function as a platform to place IC under test, and as a channel for input and output IC under test to be connected to microcontroller as central processing unit. Through this method, all input combinations are considered for tests. For this project, IC might be tested have for IC logic gates. The result is generated on the LCD either the IC is good or faulty. Based on the efficiency of the project, the data is recorded based on the five times trial every each of the IC

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